JPS5129953A - Kangekioyobi sennodenki kogakutekisokuteihohooyobisochi - Google Patents

Kangekioyobi sennodenki kogakutekisokuteihohooyobisochi

Info

Publication number
JPS5129953A
JPS5129953A JP50084553A JP8455375A JPS5129953A JP S5129953 A JPS5129953 A JP S5129953A JP 50084553 A JP50084553 A JP 50084553A JP 8455375 A JP8455375 A JP 8455375A JP S5129953 A JPS5129953 A JP S5129953A
Authority
JP
Japan
Prior art keywords
sennodenki
kogakutekisokuteihohooyobisochi
kangekioyobi
sennodenki kogakutekisokuteihohooyobisochi
kangekioyobi sennodenki
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP50084553A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5513525B2 (en]
Inventor
Rii Kasudan Haabei
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Itochu Corp
Original Assignee
Itochu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Itochu Corp filed Critical Itochu Corp
Publication of JPS5129953A publication Critical patent/JPS5129953A/ja
Publication of JPS5513525B2 publication Critical patent/JPS5513525B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/024—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of diode-array scanning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/14—Measuring arrangements characterised by the use of optical techniques for measuring distance or clearance between spaced objects or spaced apertures
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/30—Nc systems
    • G05B2219/37—Measurements
    • G05B2219/37397—Measuring gap between tool and workpiece

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
JP50084553A 1974-07-11 1975-07-11 Kangekioyobi sennodenki kogakutekisokuteihohooyobisochi Granted JPS5129953A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/487,588 US3937580A (en) 1974-07-11 1974-07-11 Electro-optical method for measuring gaps and lines

Publications (2)

Publication Number Publication Date
JPS5129953A true JPS5129953A (en) 1976-03-13
JPS5513525B2 JPS5513525B2 (en]) 1980-04-09

Family

ID=23936356

Family Applications (1)

Application Number Title Priority Date Filing Date
JP50084553A Granted JPS5129953A (en) 1974-07-11 1975-07-11 Kangekioyobi sennodenki kogakutekisokuteihohooyobisochi

Country Status (2)

Country Link
US (1) US3937580A (en])
JP (1) JPS5129953A (en])

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6132910U (ja) * 1985-05-30 1986-02-27 株式会社東芝 矩形孔の巾測定装置

Families Citing this family (36)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4124300A (en) * 1976-02-23 1978-11-07 Greenwood Mills, Inc. Method for automatic fabric inspection
US4164788A (en) * 1976-10-13 1979-08-14 Atul Jain Super-resolution imaging system
JPS6111693Y2 (en]) * 1977-03-14 1986-04-12
US4173442A (en) * 1977-05-27 1979-11-06 The United States Of America As Represented By The Secretary Of Commerce Apparatus and method for determination of wavelength
US4276480A (en) * 1979-09-28 1981-06-30 Accuray Corporation Sensor position independent material property determination using radiant energy
US4340306A (en) * 1980-02-04 1982-07-20 Balasubramanian N Optical system for surface topography measurement
US4387994A (en) * 1980-02-04 1983-06-14 Balasubramanian N Optical system for surface topography measurement
GB2113501B (en) * 1981-11-26 1985-06-05 Secr Defence Imaging system
US4472029A (en) * 1982-03-01 1984-09-18 Itek Corporation Integrated wavefront compensator
FR2549952B1 (fr) * 1983-07-26 1986-12-19 Guillaume Michel Dispositif de mesure de la dimension bord a bord d'un objet par voie optique
US4650322A (en) * 1984-09-07 1987-03-17 The Board Of Trustees Of The Leland Standford, Jr. University Method and means for high resolution measurement of fiber diameter
CH666547A5 (de) * 1984-12-20 1988-07-29 Fischer Ag Georg Optisch-elektronisches messverfahren, eine dafuer erforderliche einrichtung und deren verwendung.
DD241643A1 (de) * 1985-10-09 1986-12-17 Narva Rosa Luxemburg K Messverfahren und vorrichtung zur beruehrungslosen durchmesserbestimmung duenner draehte
DE3536374A1 (de) * 1985-10-11 1987-04-16 Siemens Ag Durchlichtverfahren zur gehaeuse- und bauteilevermessung
JPS63502415A (ja) * 1986-02-20 1988-09-14 キエフスキ　ポリテヒニチェスキ　インスティテュトイメニ　５０−レティア　ベリコイ　オクトヤブルスコイ　ソツィアリスティチェスコイ　レボリュツィイ 金属切削用ｃｎｃ工作機械の切削プロセス制御システム
US4754130A (en) * 1986-10-31 1988-06-28 Stanford University Method and means for detecting optically transmitted signals and establishing optical interference pattern between electrodes
JPS6433968U (en]) * 1987-08-24 1989-03-02
US5073950A (en) * 1989-04-13 1991-12-17 Personnel Identification & Entry Access Control, Inc. Finger profile identification system
FR2657958B1 (fr) * 1990-02-06 1994-03-11 Superba Sa Procede et dispositif de mesure d'au moins une dimension transversale d'un fil textile.
US5420687A (en) * 1993-10-04 1995-05-30 Science Solutions Inc. Interferometer with processor for linearizing fringers for determining the wavelength of laser light
US5543916A (en) * 1993-10-04 1996-08-06 Science Solutions, Inc. Interferometer with alignment assembly and with processor for linearizing fringes for determining the wavelength of laser light
US5661589A (en) * 1995-02-24 1997-08-26 J. A. Woollam Co. Inc. Bilateral slit assembly, and method of use
DE19604440A1 (de) * 1996-02-07 1997-08-14 Patent Treuhand Ges Fuer Elektrische Gluehlampen Mbh Verfahren und Vorrichtung zur Beurteilung eines Ziehsteins
US5912736A (en) * 1996-11-25 1999-06-15 Lucent Technologies Inc. Optical reflection methods and apparatus for aligning communication system components
US5914785A (en) * 1998-02-04 1999-06-22 The University Of Tennesee Research Corporation Method and apparatus for making absolute range measurements
GB2345131B (en) * 1998-12-24 2003-04-16 Eastman Kodak Co Width measurement of an image-bearing sheet
DE10058216C1 (de) * 2000-11-23 2002-06-06 Infineon Technologies Ag Verfahren zur Bestimmung eines Abstandes periodischer Strukturen
US6612172B2 (en) 2001-03-05 2003-09-02 Lucent Technologies Inc. Sol-gel tube crack detection apparatus and method
US6810365B1 (en) 2002-06-13 2004-10-26 The United States Of America As Represented By The Secretary Of The Navy Monitoring waste liquid to determine membrane cleansing performance
US20050117162A1 (en) * 2003-09-30 2005-06-02 Bing Zhao Diffractive non-contact laser gauge
US7400417B2 (en) * 2005-05-23 2008-07-15 Federal Mogul World Wide, Inc. Diffraction method for measuring thickness of a workpart
JP2007294934A (ja) * 2006-03-30 2007-11-08 Canon Inc 計測方法及び装置、露光装置及び方法、調整方法、並びに、デバイス製造方法
US8260569B2 (en) * 2009-10-30 2012-09-04 Eastman Kodak Company Determining a dimension of a regular pattern of elements
US10780721B2 (en) * 2017-03-30 2020-09-22 Datamax-O'neil Corporation Detecting label stops
CN110726372B (zh) * 2019-09-24 2021-05-11 南京工程学院 一种准确处理单缝衍射图像方法
CN113720266B (zh) * 2021-08-27 2022-10-14 西安电子科技大学 基于光学傅里叶变换的电路板过孔沉铜质量检测方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3090281A (en) * 1953-07-15 1963-05-21 Centre Nat Rech Scient Optical systems
US2959105A (en) * 1958-07-24 1960-11-08 Canon Camera Co Phase noise filter and its application to photography and photolithography
DE2123833A1 (de) * 1971-05-13 1972-11-23 Siemens AG, 1000 Berlin u. 8000 München Kohärent optischer Vielkanalkorrelator
US3788749A (en) * 1972-03-13 1974-01-29 N George Image quality rating system

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6132910U (ja) * 1985-05-30 1986-02-27 株式会社東芝 矩形孔の巾測定装置

Also Published As

Publication number Publication date
US3937580A (en) 1976-02-10
JPS5513525B2 (en]) 1980-04-09

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